TESTING....

Article View: ba.test

Article #29035

#29035

From: mds
Date: Thu, 23 Apr 1992 23:24

7 lines
824 bytes

TEST TEST TEST

   
   (_________   ____   ____      
     )   )   )  /   ) (   /        
    /   /   /  /   /   `\       mds@berlioz.nsc.com  //  Santa Clara, California
___/   /   /__/___/__(___) ________________________________________________________/

Technical Details

Message-ID: <1992Apr23.232418.25847@berlioz.nsc.com>

Path: arc1-ca.pugleaf.net!sparky!uunet!charon.amdahl.com!amdahl!nsc!voder!berlioz.nsc.com!condor!mds

Show Full Headers

Complete Article Headers

X-Google-Language: ENGLISH,ASCII-7-bit
X-Google-Thread: fccf8,2e9f55c7ac7a495d,start
X-Google-Attributes: gidfccf8,public
X-Google-ArrivalTime: 1992-04-23 16:24:18 PST
Path: arc1-ca.pugleaf.net!sparky!uunet!charon.amdahl.com!amdahl!nsc!voder!berlioz.nsc.com!condor!mds
From: mds@condor
Newsgroups: ba.test
Subject: TESTING....
Message-ID: <1992Apr23.232418.25847@berlioz.nsc.com>
Date: 23 Apr 92 23:24:18 GMT
Sender: news@berlioz.nsc.com (UseNet News account)
Reply-To: mds@condor.nsc.com
Distribution: ba
Organization: National Semiconductor Corporation
Lines: 7