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1 messages
1 total messages Started by Bill Casti (System Admin) Fri, 23 Oct 1998 00:00
SPC (fwd)
#34
Author: Bill Casti (System Admin)
Date: Fri, 23 Oct 1998 00:00
31 lines
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---------- Forwarded message ----------
Date: Fri, 23 Oct 1998 19:12:51 -0700
From: Richard Miller <rlmiller@startext.net>
To: quality@pucc.Princeton.EDU
Subject: SPC

Our plant manufactures automated equipment (i.e. systems) and I want to
collect attribute data on modules, base plates, electrical sub assembly
areas.  Our sample size would be small on the module level because we
would only ship 5 systems a week and each module varies in size.  Would I
use a U-chart for charting the defects during the process and after the
modules are completely built to determine dpu?  Looking for implementation
ideas!!

Thanks

RMiller
rlmiller@startext.net


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