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Self-Checking and Fault-Tolerant Digital Design
by Parag K. Lala

Morgan Kaufmann Publishers, June 2000

http://www.mkp.com/books_catalog/catalog.asp?ISBN=0-12434-370-8

With VLSI chip transistors getting smaller and smaller, today's digital
systems are more complex than ever before. This increased complexity
leads to more cross-talk, noise, and other sources of transient errors
during normal operation. Traditional off-line testing strategies cannot
guarantee detection of these transient faults. And with critical
applications relying on faster, more powerful chips, fault-tolerant,
self-checking mechanisms must be built in to assure reliable operation.

Self-Checking and Fault-Tolerant Digital Design deals extensively with
self-checking design techniques and is the only book that emphasizes
major techniques for hardware fault tolerance. Graduate students in VLSI
design courses as well as practicing designers will appreciate this
balanced treatment of the concepts and theory underlying fault tolerance
along with the practical techniques used to create fault-tolerant
systems.

_______________________________________________________________
Morgan Kaufmann Publishers
San Francisco, California
http://www.mkp.com
orders@mkp.com


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