i860 - A question about built-in test features - Article 20339 - go-pugleaf

Article View: comp.arch

Article #20339

i860 - A question about built-in test features

#20339

From: tomo
Date: Wed, 15 Mar 1989 16:57

4 lines
559 bytes

I was told that the chip would include BIST and boundary scan features, 
however I have not seen any information posted here.
Does anyone have information on the built-in self test features of the i860?

Technical Details

Message-ID: <42494@clyde.ATT.COM>

Path:

arc1-ca.pugleaf.net!utzoo!utgpu!jarvis.csri.toronto.edu!mailrus!ames!ncar!noao!asuvax!mcdphx!mcdchg!clyde!tomo@floyd.ATT.COM

Show Full Headers

Complete Article Headers

Path: arc1-ca.pugleaf.net!utzoo!utgpu!jarvis.csri.toronto.edu!mailrus!ames!ncar!noao!asuvax!mcdphx!mcdchg!clyde!tomo@floyd.ATT.COM
From: tomo@floyd.ATT.COM
Newsgroups: comp.arch
Subject: i860 - A question about built-in test features
Keywords: i860, n10, BIST
Message-ID: <42494@clyde.ATT.COM>
Date: 15 Mar 89 16:57:29 GMT
Sender: nuucp@clyde.ATT.COM
Lines: 4