Article View: comp.arch
Article #20691Re: predicted yield of BIG microprocess
From: Steve Schoettler
Date: Fri, 07 Apr 1989 16:44
Date: Fri, 07 Apr 1989 16:44
27 lines
1491 bytes
1491 bytes
In article <46500056@uxe.cso.uiuc.edu> mcdonald@uxe.cso.uiuc.edu writes:
>>Year 1984 1987 1989 1992
>>Defect density [cm^(-2)] 1.83 1.16 0.72 0.38
>
>What I want is a BIG CCD camera chip. How do these relate in
>manufacturability to memories or CPU's.
This is the classic application for a neural network!
More seriously, there have been some good ideas on image processing
with partial data. Here are some relevant papers in case you're interested:
Carnevali, P. and Coletti, L., and Patarnello, S. "Image Processing by
Simulated Annealing," IBM Journal of Research and Development 29(6):569-579,
1985.
Geman, Stuart and Geman, Donald. "Stochastic Relaxation, Gibbs Distributions,
and the Bayesian Restoration of Images," IEEE PAMI 6:721-741, 1984.
Steve
--
Steve Schoettler
shs@uts.amdahl.com
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Amdahl Corp., M/S 213, 1250 E. Arques Ave, Sunnyvale, CA 94088
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Path: arc1-ca.pugleaf.net!utzoo!utgpu!utstat!jarvis.csri.toronto.edu!mailrus!tut.cis.ohio-state.edu!bloom-beacon!apple!amdahl!shs From: shs@uts.amdahl.com (Steve Schoettler) Newsgroups: comp.arch Subject: Re: predicted yield of BIG microprocess Keywords: ccd neural Message-ID: <16gWR37hbH10108sRIM@amdahl.uts.amdahl.com> Date: 7 Apr 89 16:44:57 GMT References: <15878@obiwan.mips.COM> <46500056@uxe.cso.uiuc.edu> Reply-To: shs@amdahl.uts.amdahl.com (Steve Schoettler) Organization: Amdahl Corporation, Sunnyvale CA Lines: 27