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#76

From: Laurence Leff
Date: Mon, 16 Jul 1990 15:43

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Technical Report 90-21 is now available in the MCNC Library (bonnie@mcnc or
248-1853).  It is entitled "Oxygen Ion Defect Generation in Gate Insulators
of Insulated Gate Field-Effect Transistors and X-radiation Susceptibility
of These Ion Damage Gate Insulators" by C.T. Sune, A. Reisman, and C.K.
Williams.

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From: leff@CSVAX.SEAS.SMU.EDU (Laurence Leff)
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Subject: tr-input/stuff4
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Date: 16 Jul 90 15:43:53 GMT
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