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          University of California at Santa Cruz
  Baskin Center for Computer Engineering and Information Sciences 

The following technical report is available electronically or as
a paper copy.  Instructions for getting either follow the abstract.


UCSC-CRL-91-24  (available electronically as ucsc-crl-91-24.ps.Z)
CARAFE:  AN INDUCTIVE FAULT ANALYSIS TOOL FOR CMOS VLSI CIRCUITS
Alvin Lun-Knep Jee
June 1991, 37 pages (paper copy $7.00)

Abstract:  Traditional fault models for testing CMOS VLSI circuits
do not take into account the actual mechanisms that precipitate faults.
As a result, the failure modes of a circuit as predicted by these
fault models may not reflect the realistic failure modes of the
circuit.
      This thesis reports on the Carafe software which
determines the realistic bridge faults of the CMOS circuit based on
its layout.  Each fault found by Carafe is assigned a relative
probability based on the geometry of the fault site and defect
distributions of the fabrication process.  Carafe improves upon
previous software in that it is easier to use, more robust, and
more time and memory efficient so that larger circuits can be
analyzed.
Keywords:  Fault models, VLSI testing, CMOS, inductive fault analysis.


This technical report is available electronically through either 
of the following methods:  

1.  through anonymous ftp from ftp.cse.ucsc.edu, in /pub/tr. Log in 
    as "anonymous", use your email address as your password, specify 
    "binary" before getting the file.  Uncompress before printing.
2.  by mail to automatic mail server rnalib@ftp.cse.ucsc.edu.
    Put this command on the subject line or in the body of the message:
    	@@ send ucsc-crl-91-24.ps.Z from tr
    To get the index or abstract list:
	@@ send INDEX from tr
	@@ send ABSTRACTS.1992 from tr
    To get the list of the tr directory:
	@@ list tr
    To get the list of commands and their syntax:
	@@ help commands

Order paper copies of entire tech report from:  Technical Library, 
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Questions:  jean@cse.ucsc.edu


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