🚀 go-pugleaf

Bjorn, the points that you make are indeed valid. However, it is still
early to disgard IDDQ for a number of reasons. First, a number of researchers
such as Maly and Hawkins have shown IDDQ to be effective when used as an additional screen
and a good way to augment stuck-at and functional testing. Second, one cannot look at
any one test method in isolation for all levels of the maufacturing process from
die level to chip level to card level. There are many different test activities and, if used
properly, IDDQ can be effective in helping to assure higher quality levels. Finally, 
IDDQ is still far from being a mature test method and much research remains to be done
in areas such as designing current-testable circuits, combining IDDQ with boundary scan, etc...

Bjorn, thanks for your comments. I enjoyed thinking about the questions that you posed.



-Rafic Makki