🚀 go-pugleaf

You folks were so helpful the last time I tried this (I was writing a
product survey on boundary scan at the time), I thought I'd do
it again.  I hope I'm not wearing out my welcome.  :)

I am beginning to research an article for the May 1993 issue of Test &
Measurement World.  The working title is "Test Development in a
Top-Down Design Environment."  My idea is to describe what a top-down
design environment is, show where test development fits into this
process, and talk about some of the tools and how to use them.

If any of you have experience with type of development or the
test-development tools and would be willing to talk about it, please
contact me.

Thanks, Dan
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        Dan Romanchik              |        danr@umcc.ais.org
       Technical Editor            |         (313) 930-6564
    Test & Measurement World       |     MCI Mail: tmwromanchik
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  For a copy of Test & Measurement World, the magazine for test and
     inspection in electronics, send me your U.S. Mail address.
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