🚀 go-pugleaf

Dear reader

In many papers in the field of fault diagnosis and Test generation for digital
circuits I have seen benchmark circuits used to make comparison between the
speed and effeciency of various test generation methods.

I have commonly seen labels such as C880, C5315 or C7552 used to describe or
mension these benchmark circuits. In many papers on this topic also I have seen
the following reference to this circuits mensioned:

(*) F. Brglez and H. Fujiwara, "A neutral netlist of ten combinational
benchmark circuits and a target translator in FORTRAN," in Proc. IEEE Int.
Symp. on Circuits and Systems, Kyoto, Japan, June 5-7, 1985

One place that I found this reference mensioned was in :

(*) Short Papers "Expremental Evaluation of Testability Measure for Test
Generation" by Chandra & Patel in IEEE trans. on Computer Aided Design Vol. 8,
No. 1 January 1989.

I need to know the following:

(1) What are these benchmark circuits ?

(2) Where can I get these from ?

(3) What is the Brglez & Fujiwara reference ( I could not locate it ) ?

(4) How can I use the above benchmark netlist to test a test generation method?

(5) Is there a updated version of this which has come out since 1989 ?


I would be very greatfull if some one could help me by responding to the
following e-mail address:

		8809787L@LV.LEVELS.UNISA.EDU.AU

Thank you very much, and hope to hear from you soon.


Yours faithfully
Peyam Pourbeik


School of Electronic Engineering
University of South Australia ( Levels campus )
Adelaide, South Australia, Australia