Article View: comp.lsi.testing
Article #34Re: Change this Group Name?
From: JUSTIN HARLOW
Date: Fri, 28 Aug 1992 09:42
Date: Fri, 28 Aug 1992 09:42
43 lines
2865 bytes
2865 bytes
In article <BtnwwM.EBA@metaflow.com> rschnapp@metaflow.com (Russ Schnapp) writes: >In article <veit.714837724@du9ds3>, veit@du9ds3.uni-duisburg.de (Holger Veit) writes: >|> In <1992Aug25.183729.27815@venus.ic.cmc.ca> yooho@ursula.ic.cmc.ca (Yoo Ho Cho) writes: >|> >|> >In article <l9ko46INNls@bashful.crhc.uiuc.edu> patel@bashful.crhc.uiuc.edu (Janak H. Patel) writes: >|> >>I am annoyed at notes posted in this news group which have nothing to >|> >>do with LSI or VLSI Testing. It seems lots of news readers are >|> >>interpreting "testing" to mean just about anything, except what >|> >>this group was created for! It seems they ignore the components "comp" >|> >>and/or "lsi" while interpreting "testing". >|> > >You know, the message traffic over the discussion of changing the name of the >newsgroup has by far exceeded the actual garbage traffic I've seen here in >the last couple of months. Does the pain of the disease really justify the >pain of the cure? Is this a problem worth fixing? > I agree that the group could have a less ambiguous name, but we are probably stuck with it, given the alternatives. Russ (and others) point out the central issue: why don't we get any postings? Is the name of this group the only testing issue left? Come on, Janak: you have lots of good things going on at UIUC: how about some timely, controversial postings from you and/or your group? Let's talk about the issues raised by Don Allingham: why don't undergrad profs incorporate testing ideas in their earliest classes? I'll throw a thought game onto the table: Suppose we had a manufacturing line whose yield was 100%... would we then not need to test products? <Everyone cringes... of COURSE we would test, they cry!> You could take the position that, in this ideal environment, what we are actually doing through end-of-line testing was verifying the function of the design; could we not do that through formal methods as we designed the device? More generally speaking, how much of what we call testing is actually a cover for lack of design verification? Let's see if that stirs the pot.... JEH -- ------------------------------------------------------------------------- Justin E. Harlow III Office: harlow@src.org Vox: 919/541-9464 School: jharlow@egr.duke.edu Fax: 919/541-9450 Snail: SRC, PO Box 12053, RTP, NC 27709
Technical Details
Message-ID:
<4945@news.duke.edu>Path:
arc1-ca.pugleaf.net!sparky!uunet!gatech!concert!duke!news.duke.edu!acpub.duke.edu!jehReferences:
<1992Aug25.183729.27815@venus.ic.cmc.ca> <veit.714837724@du9ds3> <BtnwwM.EBA@metaflow.com>Show Full Headers
Complete Article Headers
Path: arc1-ca.pugleaf.net!sparky!uunet!gatech!concert!duke!news.duke.edu!acpub.duke.edu!jeh From: jeh@acpub.duke.edu (JUSTIN HARLOW) Newsgroups: comp.lsi.testing Subject: Re: Change this Group Name? Message-ID: <4945@news.duke.edu> Date: 28 Aug 92 09:42:50 GMT References: <1992Aug25.183729.27815@venus.ic.cmc.ca> <veit.714837724@du9ds3> <BtnwwM.EBA@metaflow.com> Sender: news@news.duke.edu Organization: Duke University; Durham, N.C. Lines: 43 Nntp-Posting-Host: raphael.acpub.duke.edu