Article View: comp.lsi.testing
Article #36Rise and shine
From: Praveen Vishakantaiah
Date: Fri, 28 Aug 1992 14:36
Date: Fri, 28 Aug 1992 14:36
71 lines
4352 bytes
4352 bytes
It is very interesting to delve into the reasons why this group is having problems getting any postings. Here are my two cents worth to motivate test engineers to generate useful and relevant discussions even in the midst of unencouraging number of postings in this group. Holger> I cannot imagine that everyone is interested in design Holger> (comp.lang.vhdl, comp.lang.verilog, comp.sys.mentor, comp.lsi*), Holger> but nobody in testing of all the stuff produced. Well, isn't testing harder than designing ;-). Nobody has proved VLSI design to be an NP-complete problem (as far as I know)! Also, if you look at the topics that are discussed in the design groups, most of them are centered around the usage/bugs of a commercial design tool or how to obtain free software. There are not as many commercial test tools or free test software that is as widely used as design software in order to generate postings in this category. Allingham> Hopefully, someday all designers will realize that test needs Allingham> to be considered up front. This is a very interesting point, but test engineers or project managers cannot just hope for this to happen:-). I don't think the designers can be forced to learn the test strategies from somewhere and expect them to start putting lot of man hours into incorporating test ideas as they design. The test tools and research should be directed towards automating the interaction between design and test and I feel that this is happening now. Test research and tools should not just aim at producing 100% fault coverage for a particular category of faults. Harlow> Come on, Janak: you have lots of good things going on at UIUC: how Harlow> about some timely, controversial postings from you and/or your Harlow> group? Although this is a very good and useful suggestion, it is very unlikely that researchers are ready to discuss their ideas openly due to competitive reasons. But, we can always discuss published work as well as get feedback from people in the industry as to the research direction in testing which would be useful to them. Harlow> Suppose we had a manufacturing line whose yield was 100%... Harlow> would we then not need to test products? ......... Harlow> ................. Harlow> More generally speaking, how much of what we call testing is Harlow> actually a cover for lack of design verification? The way I would look at this question before answering it, is - To prove that the yield was 100%, would I use design verification or testing? I would use testing since formal verification of designs does not handle manufacturing defects in the strict sense. But again, you can use information generated during formal verification to potentially obtain test vectors. I would say, formal verification and testing are two sides of the same coin. The value is the same, but they look different depending on which side you want to look at! Rise and shine, all you testing folks. Spend some time posting useful discussions pertaining to VLSI testing. Don't work too hard on the testing problem [I hope my advisor does not see this:-)]. After all, the testing problem was NP-complete, is NP-complete and will be NP-complete!! Praveen Vishakantaiah. ------------------------------------------------------------------------------ -- Microelectronics and Computer Technology Corporation, | Ph : (512)338-3736| -- 3500 W. Balcones Center Drive | e-mail : | -- Austin, TX 78759. | praveen@mcc.com | ------------------------------------------------------------------------------ -- ALSO A HARD WORKING MEMBER OF :-) -- Computer Engineering Research Center, | Ph : (512)471-8013| -- University of Texas, Austin. e-mail : praveen@cerc.utexas.edu | -----------------------------------------------------------------------------
Technical Details
Message-ID:
<1992Aug28.143621.1917@mcc.com>Path:
arc1-ca.pugleaf.net!sparky!uunet!cs.utexas.edu!milano!sirius.mcc.com!praveenShow Full Headers
Complete Article Headers
Newsgroups: comp.lsi.testing Path: arc1-ca.pugleaf.net!sparky!uunet!cs.utexas.edu!milano!sirius.mcc.com!praveen From: praveen@sirius.mcc.com (Praveen Vishakantaiah) Subject: Rise and shine Message-ID: <1992Aug28.143621.1917@mcc.com> Sender: news@mcc.com Nntp-Posting-Host: sirius.mcc.com Organization: Microelectronics and Computer Technology Corp. Date: Fri, 28 Aug 1992 14:36:21 GMT Lines: 72