Article View: comp.lsi.testing
Article #50Ring oscillators for characterization?
From: David C. Black
Date: Thu, 03 Sep 1992 11:28
Date: Thu, 03 Sep 1992 11:28
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1497 bytes
In article <tapas.715497268@femto.engr.mun.ca> tapas@pooh.engr.mun.ca (Tapas Banerjee) writes: TAPAS> I was wondering, what kind of problems do you face when you want to TAPAS> take out couple of tens of MHz freq. out of a chip and what kind of TAPAS> care is to be taken in measurement of those signals (i.e. the signals TAPAS> out of chip). Along a similar line, I am interested in others experience with using on-chip ring-oscillators to gather characterization data. Local experiences suggest these are not very easy to use and perhaps useless. Does anyone have data on successes? We are designing with CMOS .8 - 1 micron gate arrays and standard cell technologies. -- | David C. Black Electrical Engineer | | Tandem Computers Incorporated Guardian: SMTPGATE@AUSTIN(black@tzone) | | 14231 Tandem Blvd. Internet: black@mpd.tandem.com | |_Austin, Texas 78728-6699________Phone: (512) 244-8321__________________|
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Path: arc1-ca.pugleaf.net!sparky!uunet!cs.utexas.edu!devnull!black From: black@mpd.tandem.com (David C. Black) Newsgroups: comp.lsi.testing Subject: Ring oscillators for characterization? Summary: Are they a good idea? Over voltage/temperature/process? Keywords: Ring oscillator, High freq., off-chip measurement Message-ID: <2374@devnull.mpd.tandem.com> Date: 3 Sep 92 11:28:32 GMT Sender: news@devnull.mpd.tandem.com Reply-To: black@auriga.UUCP (David C. Black) Organization: /etc/organization Lines: 18