Re: board test

Article View: comp.lsi.testing

Article #98

#98

From: Daniel Romanchik
Date: Sat, 21 Nov 1992 19:57

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In article <lglr0dINN5oj@news.bbn.com> ekearns@bbn.com (Edward Joseph Kearns) writes:
>
>You are more than welcome to comp.lsi.testing.  In fact 1149.1 is 
>exactly why I came here a few weeks ago.  There was considerable
>response to my request for experince on the topic of boundary-scan,
>and by judging the responses I received, you will find no better
>forum to ask such questions.  Apparently this is where the 1149.1 
>experts occasionally hang out.
>
   Great! I'm glad to see some talk about board test here.

>I ordered and received some books from IEEE.  "The Test Access Port
>and Boundary Scan Architecture" by Maunder and Tulloss,  and also
>"Integrating Design and Test: Using CAE Tools for ATE Programming"
>by Ken Parker, so I've been busy reading.
>
    Ken Parker has a new book out, _The Boundary Scan Handbook_.  It's
published by Kluwer, and I think it's pretty good.  I can post my
review of it here if people are interested.

Regards, Dan
=====================================================================
        Dan Romanchik              |        danr@umcc.ais.org
       Technical Editor            |         (313) 930-6564
   Test and Measurement World      |     MCI Mail: tmwromanchik
=====================================================================
   "You can't test in quality" --  ancient Test Engineering maxim
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Message-ID: <By30r3.GxH@ais.org>

Path: arc1-ca.pugleaf.net!sparky!uunet!spool.mu.edu!umn.edu!umeecs!ais.org!danr

References: <1992Nov18.170306.4244@titan.ksc.nasa.gov> <lglr0dINN5oj@news.bbn.com>

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Newsgroups: comp.lsi.testing
Path: arc1-ca.pugleaf.net!sparky!uunet!spool.mu.edu!umn.edu!umeecs!ais.org!danr
From: danr@ais.org (Daniel Romanchik)
Subject: Re: board test
Message-ID: <By30r3.GxH@ais.org>
Organization: UMCC
References: <1992Nov18.170306.4244@titan.ksc.nasa.gov> <lglr0dINN5oj@news.bbn.com>
Date: Sat, 21 Nov 1992 19:57:01 GMT
Lines: 28

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