🚀 go-pugleaf

RetroBBS NetNews Server

Inspired by RockSolid Light RIP Retro Guy

Article View: comp.lsi.testing
Article #50

Ring oscillators for characterization?

#50
From: David C. Black
Date: Thu, 03 Sep 1992 11:28
18 lines
1497 bytes
In article <tapas.715497268@femto.engr.mun.ca> tapas@pooh.engr.mun.ca
(Tapas Banerjee) writes:

TAPAS> I was wondering, what kind of problems do you face when you want to
TAPAS> take out couple of tens of MHz freq. out of a chip and what kind of
TAPAS> care is to be taken in measurement of those signals (i.e. the signals
TAPAS> out of chip).

Along a similar line, I am interested in others experience with using
on-chip ring-oscillators to gather characterization data.  Local experiences
suggest these are not very easy to use and perhaps useless.  Does anyone
have data on successes?  We are designing with CMOS .8 - 1 micron gate
arrays and standard cell technologies.
-- 
| David C. Black                  Electrical Engineer                    |
| Tandem Computers Incorporated   Guardian: SMTPGATE@AUSTIN(black@tzone) |
| 14231 Tandem Blvd.              Internet: black@mpd.tandem.com         |
|_Austin, Texas 78728-6699________Phone: (512) 244-8321__________________|
Technical Details
Message-ID: <2374@devnull.mpd.tandem.com>
Path: arc1-ca.pugleaf.net!sparky!uunet!cs.utexas.edu!devnull!black

Show Full Headers
Complete Article Headers
Path: arc1-ca.pugleaf.net!sparky!uunet!cs.utexas.edu!devnull!black
From: black@mpd.tandem.com (David C. Black)
Newsgroups: comp.lsi.testing
Subject: Ring oscillators for characterization?
Summary: Are they a good idea? Over voltage/temperature/process?
Keywords: Ring oscillator, High freq., off-chip measurement
Message-ID: <2374@devnull.mpd.tandem.com>
Date: 3 Sep 92 11:28:32 GMT
Sender: news@devnull.mpd.tandem.com
Reply-To: black@auriga.UUCP (David C. Black)
Organization: /etc/organization
Lines: 18