Article View: comp.lsi
Article #359Re: Wanted: Electronic CTE Failure Data
From: Mark G. Johnson
Date: Wed, 17 Oct 1990 20:23
Date: Wed, 17 Oct 1990 20:23
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1266 bytes
In article <4553@trantor.harris-atd.com> dmp@epg.harris.com (Donald Patterson) writes:
> ... an expert system which would "design around" potential failures
> due to thermal mismatch.
One source of data is Bob Widlar, linear designer extrordinaire.
He takes up the problem of unintentional voids in the thermal attachment:
Robert J. Widlar, "Controlling Secondary Breakdown of Bipolar Power
Transistors," Digest of Technical Papers, International Solid-State
Circuits Conference (ISSCC) 1981, pp. 44-45.
R. J. Widlar and M. Yamatake, "A 150W Opamp", ISSCC 1985, pp. 140-141.
--
-- Mark Johnson
MIPS Computer Systems, 930 E. Arques M/S 2-02, Sunnyvale, CA 94086
(408) 524-8308 mark@mips.com {or ...!decwrl!mips!mark}
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Path: arc1-ca.pugleaf.net!utzoo!attcan!uunet!cs.utexas.edu!swrinde!zaphod.mps.ohio-state.edu!mips!hal!mark From: mark@mips.COM (Mark G. Johnson) Newsgroups: comp.lsi,sci.electronics Subject: Re: Wanted: Electronic CTE Failure Data Keywords: thermal mismatch, failure Message-ID: <42189@mips.mips.COM> Date: 17 Oct 90 20:23:35 GMT References: <4553@trantor.harris-atd.com> Sender: news@mips.COM Reply-To: mark@mips.COM (Mark G. Johnson) Followup-To: comp.lsi Organization: MIPS Computer Systems, Inc. Lines: 16