🚀 go-pugleaf

In <3185@inews.intel.com> bhoughto@pima.intel.com (Blair P. Houghton) writes:
>In article <veit.669557680@du9ds3> veit@du9ds3.uni-duisburg.de (Holger Veit) writes:
>>NAME: 
>>    comp.lsi.cat

>You never explained why "CAT" is the extension in the name of the group.

>It would seem more appropriate to me that "ATE", for
>"Automated Test Engineering", would be the most appropriate
>extension, since the goal of all this vlsi test methodology
>is automated test methods.

>"ATE" is a widely-used acronym for this science.

>So, how about "comp.lsi.ate"?

>				--Blair
>				  "Just another ex-Sentry-20
>				   jock, wondering if FACTOR
>				   ever got readable..."

Ok, this seems to be an omission of myself. CAT is 'computer aided testing'
and was chosen in correspondence to 'computer aided design' (comp.lsi.cad).
Actually, there are a large number of so-called CA techniques (CAE,CAD,CAM,
CAP,CASE etc.). In my knowledge, ATE is more used for E = EQUIPMENT, i.e.
the tester machine itself; and the main goal intended to be discussed in
this group is not only algorithms for automated testing, but more generally
all aspects including modelling, design-for-testability, standards ...) 
But nevertheless:
We have to overthink your proposal, beneath others like
comp.lsi.testing, and I would like to hear the net's opinion.

Holger Veit

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|  |   / Holger Veit             | INTERNET: veit@du9ds3.uni-duisburg.de
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