Article View: comp.lsi
Article #553Re: Call For Discussion: Comp.lsi.CAT
From: cs354- Broward Horne
Date: Tue, 26 Mar 1991 20:59
Date: Tue, 26 Mar 1991 20:59
31 lines
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1629 bytes
In article <3185@inews.intel.com> bhoughto@pima.intel.com (Blair P. Houghton) writes:
>
>It would seem more appropriate to me that "ATE", for
>"Automated Test Engineering", would be the most appropriate
>extension, since the goal of all this vlsi test methodology
>is automated test methods.
>
>"ATE" is a widely-used acronym for this science.
>
>So, how about "comp.lsi.ate"?
>
> --Blair
> "Just another ex-Sentry-20
^^^^^^^^^^^^^^^^^^^^^^^^^^
Well, it would appear you are MORE than a bizarro-engineerhead, Blair!
You take good care of my 953's. Hopefully you have some technical skill
as well as the B.S. degree :)
I agree. ATE is the accepted industry standard. By all means, use
' comp.lsi.ate '
See ya, Mr. ATE. I'm off to CAMland.
--
Broward Horne Coming this fall! "Jack McVax$ is Back "
horne@sapphire.idbsu.edu With his own Tokenring of 60 386's,
an030@cleveland.freenet.cwru and 1 AS/400 running MAPICTS CAM software.
ha HA! BE THERE!!!
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Path: arc1-ca.pugleaf.net!utzoo!utgpu!news-server.csri.toronto.edu!cs.utexas.edu!uunet!pmafire!mica.inel.gov!sapphire!horne From: horne@sapphire.idbsu.edu (cs354- Broward Horne) Newsgroups: comp.lsi,comp.theory,comp.lang.vhdl Subject: Re: Call For Discussion: Comp.lsi.CAT Keywords: comp.lsi.cat Message-ID: <1991Mar26.205904.1346@sapphire.idbsu.edu> Date: 26 Mar 91 20:59:04 GMT References: <veit.669557680@du9ds3> <3185@inews.intel.com> Organization: Boise State University, Boise Lines: 31