Article View: comp.lsi
Article #896Re: Soft Error rates in dynamic RAM
From: Mark G. Johnson
Date: Fri, 25 Sep 1987 15:50
Date: Fri, 25 Sep 1987 15:50
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1556 bytes
In article <1309@leo.UUCP>, larry@leo.UUCP (Larry Johnson) writes
> I am in the process of designing a DRAM for a chip set and
> need to determine the soft error rate. The data I can't seem
> to get my hands on is the alpha particle flux rate caused by
> the package lid and the metal traces on the wafer.
> Does anyone out there have typical numbers for this, and does
> anyone have any good reference papers they could recommend.
> Better still, did any of you write a paper on SER?
The best single source is the proceedings of the IEEE International
Electron Devices Meetings ("IEDM"). I strongly recommend this paper:
Dennis Segers et al., "Circuit Design Methodologies for the
Reduction of Alpha Soft Error Rate", IEDM Technical Digest,
December 1983, pp. 331-5.
as it covers design and test issues for modern (i.e. VCC/2 bitline) dRAMs.
--
-Mark Johnson *** DISCLAIMER: The opinions above are personal. ***
UUCP: {decvax,ucbvax,ihnp4}!decwrl!mips!mark TEL: 408-720-1700 x208
US mail: MIPS Computer Systems, 930 E. Arques, Sunnyvale, CA 94086
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Relay-Version: version B 2.10 5/3/83; site utzoo.UUCP Path: arc1-ca.pugleaf.net!utzoo!mnetor!uunet!husc6!mit-eddie!ll-xn!ames!sdcsvax!ucbvax!decvax!decwrl!pyramid!prls!mips!mark From: mark@mips.UUCP (Mark G. Johnson) Newsgroups: comp.lsi Subject: Re: Soft Error rates in dynamic RAM Message-ID: <709@obiwan.UUCP> Date: Fri, 25-Sep-87 11:50:02 EDT Article-I.D.: obiwan.709 Posted: Fri Sep 25 11:50:02 1987 Date-Received: Sun, 27-Sep-87 05:44:46 EDT Lines: 22 Keywords: IEDM