Electron Microscopy Applications for the Mac.

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Article #38320

#38320

From: John F. Mansfield
Date: Fri, 24 Feb 1989 23:20

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Hi there, this is a general request to anyone who uses both
Macintoshes and Electron Microscopes.  I realise that this may well be
a very select group, but if there are others on the network who have
similar interests to my own then I would be only too glad to hear from
them and trade ideas and infromation.

I am interested in finding anyone who is developing, or knows of others
developing, hardware and/or software for spectral acquisation and analysis
on the Macintosh.  Any kind of spectra would be interesting, but XEDS,
EELS, AES, XPS and WDS.  Also, I am interested in diffraction pattern
analysis, either electron (LEED, SAD or CBED), X-ray or neutron.

I am interested in both commercial and public domain software.

Please reply by email to:


WDS would be of particular interest. (Excuse the accronyms)

John Mansfield
North Campus Electron Microbeam Analysis Laboratory 2455 Hayward, Ann Arbor,
Michigan 48109-2143. 313-936-3352
Internet: jfm@ruddles.sprl.umich.edu or john_mansfield.um.cc.umich.edu

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Path: arc1-ca.pugleaf.net!utzoo!utgpu!jarvis.csri.toronto.edu!mailrus!caen.engin.umich.edu!ruddles.sprl.umich.edu!jfm
From: jfm@ruddles.sprl.umich.edu.engin.umich.edu (John F. Mansfield)
Newsgroups: comp.sys.mac
Subject: Electron Microscopy Applications for the Mac.
Keywords: AEM, TEM, SEM, XEDS, EELS, CBED, Image Processing
Message-ID: <41ac4780.a590@mag.engin.umich.edu>
Date: 24 Feb 89 23:20:00 GMT
Sender: netnews@caen.engin.umich.edu
Reply-To: jfm@ruddles.sprl.umich.edu.UUCP (John F. Mansfield)
Organization: University of Michigan, Ann Arbor
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