VLSI testing (Cormen et.al.)

Article View: comp.theory

Article #1845

#1845

From: Bob Weems
Date: Thu, 27 Jun 1991 15:01

13 lines
1024 bytes

Cormen, Leiserson, and Rivest's "Introduction to Algorithms" gives
a problem on testing chips pairwise.  The goal of the problem
is to demonstrate that the good chips (which are in the majority)
can be found in linear time.  Since the problem is in an early chapter
on solving recurrences, it does not seem that the algorithm
should be that challenging.  Nonetheless, it has me stumped.
The problem seems related to system-level fault diagnosis and
the 1967 IEEE T-C paper of Preparata et.al., but that seems like overkill.

Send responses by email.

Bob Weems
weems@cse.uta.edu

Technical Details

Message-ID: <1991Jun27.150152.26368@cse.uta.edu>

Path:

arc1-ca.pugleaf.net!utzoo!utgpu!news-server.csri.toronto.edu!rpi!zaphod.mps.ohio-state.edu!qt.cs.utexas.edu!cs.utexas.edu!cse!weems

Show Full Headers

Complete Article Headers

Path: arc1-ca.pugleaf.net!utzoo!utgpu!news-server.csri.toronto.edu!rpi!zaphod.mps.ohio-state.edu!qt.cs.utexas.edu!cs.utexas.edu!cse!weems
From: weems@cse.uta.edu (Bob Weems)
Newsgroups: comp.theory
Subject: VLSI testing (Cormen et.al.)
Summary: Pg 47 Problem 4-7
Message-ID: <1991Jun27.150152.26368@cse.uta.edu>
Date: 27 Jun 91 15:01:52 GMT
Sender: Bob Weems
Organization: Computer Science Engineering Univ. of Texas at Arlington
Lines: 13