Article View: fj.test
Article #1024Re: test
From: Hidekazu Takahashi
Date: Tue, 15 Dec 1992 02:09
Date: Tue, 15 Dec 1992 02:09
2 lines
618 bytes
618 bytes
test
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<THIDE.92Dec15110746@craps.elcom.nitech.ac.jp>Path:
arc1-ca.pugleaf.net!sparky!uunet!stanford.edu!sun-barr!sh.wide!wnoc-kyo!kuis!kudpc!nucc!nitgw!thideReferences:
<THIDE.92Dec14151853@craps.elcom.nitech.ac.jp> <THIDE.92Dec14154959@craps.elcom.nitech.ac.jp>Show Full Headers
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Newsgroups: fj.test Path: arc1-ca.pugleaf.net!sparky!uunet!stanford.edu!sun-barr!sh.wide!wnoc-kyo!kuis!kudpc!nucc!nitgw!thide From: thide@craps.elcom.nitech.ac.jp (Hidekazu Takahashi) Subject: Re: test In-Reply-To: thide@craps.elcom.nitech.ac.jp's message of Mon, 14 Dec 1992 06:51:15 GMT Message-ID: <THIDE.92Dec15110746@craps.elcom.nitech.ac.jp> Sender: news@nitgw.elcom.nitech.ac.jp Organization: Nagoya Institute of Technology ,Nagoya ,Japan References: <THIDE.92Dec14151853@craps.elcom.nitech.ac.jp> <THIDE.92Dec14154959@craps.elcom.nitech.ac.jp> Distribution: fj Date: Tue, 15 Dec 1992 02:09:03 GMT Lines: 2