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Article #20231Re: old EPROMs (was Re: Long-Life battery and clock)
From: Craig McCluskey
Date: Wed, 14 Dec 1988 21:17
Date: Wed, 14 Dec 1988 21:17
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> There are various types of failure modes in solid-state circuits > which would manifest themselves over this period of time; such failure > modes include, but are not limited to: (1) undesireable migration and > diffusion effects; (2) corrosion effects; and (3) growth of micro-fine > metallic "whiskers". Present reliability design and testing methods > for semiconductors do not cover the eventualities of a 100-year service > life. I recall discussions at college that a manned stellar probe would have to have an IC fab facility on board so they could build new ICs to replace the ones that failed because of diffusion. Craig McCluskey
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arc1-ca.pugleaf.net!utzoo!attcan!uunet!lll-winken!lll-lcc!ames!oliveb!pyramid!hplabs!hpfcdc!hpldola!hp-lsd!craigReferences:
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Path: arc1-ca.pugleaf.net!utzoo!attcan!uunet!lll-winken!lll-lcc!ames!oliveb!pyramid!hplabs!hpfcdc!hpldola!hp-lsd!craig From: craig@hp-lsd.HP.COM (Craig McCluskey) Newsgroups: sci.electronics Subject: Re: old EPROMs (was Re: Long-Life battery and clock) Message-ID: <7600015@hp-lsd.HP.COM> Date: 14 Dec 88 21:17:32 GMT References: <1310017@hpcilzb.HP.COM> Organization: HP Logic Systems Division - ColoSpgs, CO Lines: 12