PAL failures (was: Re: OTP (really?) EPROMS)

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Article #3448

#3448

From: Geoff Steckel - Sun BOS Software
Date: Tue, 17 Oct 1989 22:01

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Last time I heard, fuse link programmable PLDs had about a 2% programming
failure rate.  I've certainly had my share.  Some PROMs (fuse, not E or EE)
have about a 50% failure rate - type # and manufacturer deleted...

The ability to test 100% in the factory is one of the selling points for
E/EE/RAM based programmable logic devices.

	geoff steckel (gws%omnivor.uucp@wjh12.harvard.EDU)

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References: <841@dms.UUCP> <15357@vlsisj.VLSI.COM> <23127@cup.portal.com> <27785@amdcad.AMD.COM>

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Path: arc1-ca.pugleaf.net!utzoo!utgpu!jarvis.csri.toronto.edu!mailrus!tut.cis.ohio-state.edu!gem.mps.ohio-state.edu!ginosko!uunet!seismo!sundc!newstop!east!jeska!gsteckel
From: gsteckel@jeska.East.Sun.COM (Geoff Steckel - Sun BOS Software)
Newsgroups: sci.electronics
Subject: PAL failures (was: Re: OTP (really?) EPROMS)
Summary: fuse PLDs don't program every time
Keywords: PALs
Message-ID: <933@east.East.Sun.COM>
Date: 17 Oct 89 22:01:21 GMT
References: <841@dms.UUCP> <15357@vlsisj.VLSI.COM> <23127@cup.portal.com> <27785@amdcad.AMD.COM>
Sender: news@east.East.Sun.COM
Reply-To: gsteckel@jeska.East.Sun.COM (Geoff Steckel - Sun BOS Software)
Distribution: usa
Organization: Sun Microsystems, Billerica MA
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