Article View: sci.electronics
Article #6817PROM durability (ESD-wise)
From: kevins
Date: Thu, 20 Aug 1992 05:17
Date: Thu, 20 Aug 1992 05:17
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1119 bytes
How immune are bipolar PROM's (low density (32x8)) to harsh environments? Are they as sturdy as general LSTTL? Any worse than CMOS? Which pins are the succeptable ones: VCC, GND, Addr, Data, OE? All but the address pins are connected to the outside (for insertion into a connector). How can I protect the device so that it has better chances of surviving human (non-grounded) environments? Any and all help will be greatly appreciated. -=-=-=-=-=-=-=-=-=-=-=-=-=-=-=-=-=-=-=-=-=-=-=-=-=-=-=-=-=-=-=-=-=-=-=-=-=-=-=-= Kevin B. Stanton Internet: kevins@ee.pdx.edu Portland State University Dept. of Electrical Engineering (503) 725-5422 Box 751, Portland, Oregon 97207
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Path: arc1-ca.pugleaf.net!sparky!uunet!cis.ohio-state.edu!zaphod.mps.ohio-state.edu!rpi!uwm.edu!ogicse!pdxgate!donald.ee.pdx.edu!kevins From: kevins@donald.ee.pdx.edu Newsgroups: sci.electronics Subject: PROM durability (ESD-wise) Message-ID: <6009@pdxgate.UUCP> Date: 20 Aug 92 05:17:36 GMT Article-I.D.: pdxgate.6009 Sender: news@pdxgate.UUCP Reply-To: kevins@donald.ee.pdx.edu () Organization: Portland State University Lines: 13