Re: Canny Edge Detector

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#262

From: Dr. Steven L. Eddins
Date: Fri, 07 Aug 1992 13:24

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dubuf@sicsun.epfl.ch (Hans DU BUF) writes:


>The interested hobbyists experimenting with the CAnny edge detector
>should take a look at the recent papers by Margaret Fleck BEFORE
>starting to experiment. Just scan IEEE PAMI, I don't have a copy here.
>All the best,
>Hans

The references are:

M. M. Fleck, "Some Defects in Finite-Difference Edge Finders," IEEE
Transactions on Pattern Analysis and Machine Intelligence, vol. 14, n.
3, March 1992, pp. 337-345.

M. M. Fleck, "Multiple Widths Yield Reliable Finite Differences," IEEE
Transactions on Pattern Analysis and Machine Intelligence, vol. 14, n.
4, April 1992, pp. 412-429.
-- 
Steve Eddins	
eddins@holst.eecs.uic.edu 	(312) 996-5771 		FAX: (312) 413-0024
University of Illinois at Chicago, EECS Dept., M/C 154, 1120 SEO Bldg,
Box 4348, Chicago, IL  60680

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From: eddins@bert.eecs.uic.edu (Dr. Steven L. Eddins)
Subject: Re: Canny Edge Detector
Message-ID: <1992Aug7.132410.29816@bert.eecs.uic.edu>
Organization: EECS Dept., University of Illinois at Chicago
References: <1992Aug6.211246.9253@gdr.bath.ac.uk> <1992Aug7.121705@sicsun.epfl.ch>
Date: Fri, 7 Aug 1992 13:24:10 GMT
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