Re: Anyone working on automatic defect detection?

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#555

From: Myron Flickner
Date: Sat, 22 Aug 1992 07:03

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There are journals that cover this area, try the springer publication
'Machine Vision and Applications, an International Journal' to start
with.

imaging away / M. Flick Flickner, IBM Almaden Research Center, San Jose, CA
VNET/BITNET: FLICK at ALMADEN  Internet: flick@almaden.ibm.com

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Path: arc1-ca.pugleaf.net!sparky!uunet!ibmarc!flick.almaden.ibm.com!flick
From: flick@flick.almaden.ibm.com (Myron Flickner)
Newsgroups: sci.image.processing
Subject: Re: Anyone working on automatic defect detection?
Keywords: defect fourier convolution
Message-ID: <1933@coyote.UUCP>
Date: 22 Aug 92 07:03:31 GMT
References: <BtBx09.xG@newcastle.ac.uk>
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Organization: IBM Almaden Research Center
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