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Article #391

Re: Preferred orientation in thin film growth - papers?

#391
From: RRATEICK
Date: Sun, 24 Jan 1993 05:38
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Daniel Bergstrom (berg@uxa.cso.uiuc.edu) writes:

>I am studying the development of microstructure in sputtered metallic films.
>In particular I'm looking into how a preferred orientation of the crystal
>arises during growth. [...] Does anyone know any good papers in this area or
>related areas?

Without being insulting, have you tried "crystallographic texture"
"pole figure", or "orientation distribution" as key words?

Sounds like we are at similar stages in thesis research.  I
am investigating various texture determination methods for the analysis
of bulk titanium aluminide alloys.  A recent review may be of use to you
D.J. Dingley, V. Randle, "Review Microtexture Determination by Electron
Back-Scatter Diffraction", J. Matl. Sci., [27] 4545-4566 (1992).  Sampling
volume might be a problem with thin films?  Also, X-ray methods are used
with bulk materials.  If you have access to a texture goniometer with a thin
film attachment (I have only heard of these, Rigakku makes one, I think),
perhaps this may be able to do the job.  Color metallography may provide a
qualitative means of determining texture (G.F. Vander Voort, "Tint Etching",
Metal. Progr. March 1985, 31-41.)

A book on orientation distribution functions (a powerful way of quantifying
texture data) is available: Quantitative Texture Analysis, H.J. Bunge,
C.Esling, eds., DCM Metallurgy Information.  It is now on sale for
$28.00, call 212-679-0782.  Save the cheep binding, it looks like a good
introductory book.

By the way, I tried to reply via e-mail.  Your system bounced the messages.


RICK RATEICK
UNIVERSITY OF NOTRE DAME
RICHARD.G.RATEICK.1@ND.EDU    RRATECK@IRISHVMA
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Date: Sunday, 24 Jan 1993 00:38:19 EST
From: <RRATEICK@vma.cc.nd.edu>
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Subject: Re: Preferred orientation in thin film growth - papers?
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