Article View: sci.materials
Article #7Re: fatigue of materials
From: Kenneth J. Meltsner
Date: Wed, 28 Oct 1992 13:25
Date: Wed, 28 Oct 1992 13:25
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In article <00962AAE.508D1DE0@vms.csd.mu.edu>, 5916rahmank@vms.csd.mu.edu (K. M. A. Rahman) writes: |> I like to add one more question. I have seen that, time-dependent |> degradation in materials is termed as 'aging'. Since degradation |> lead to failure, is there any substantial difference between |> these two terms? Or just a matter of terminology? Actually, there are many alloys which improve with age, to a limited extent. Alloys which are strengthened, for example, by fine precipitates that aren't sized effectively after a typical heat treatment. Aging represents the whole spectrum of long-time phase transformation and/or growth; it doesn't mean "degradation." Would that this were true for humans as well.... [And I'd like to put a vote in for fatigue to be defined as Kekare's "progressive crack growth under cyclic or fluctuating loads." A good clean definition, and one the ceramicists would agree with if their materials didn't all start with a bunch of pre-critical length cracks. Static fatigue sounds like crack propagation to me.] =============================================================================== Ken Meltsner | meltsner@crd.ge.com (518) 387-6391 GE Research and Development Center | Fax: (518) 387-7495 P.O. Box 8, Room KWD270 | Nothing I say should be attributed Schenectady, NY 12301 | to my employer, and probably vice-versa =================== Bookcases while you wait, and wait... =====================
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Path: arc1-ca.pugleaf.net!sparky!uunet!crdgw1!rdsunx.crd.ge.com!usenet From: meltsner@crd.ge.com (Kenneth J. Meltsner) Newsgroups: sci.materials Subject: Re: fatigue of materials Message-ID: <1992Oct28.132555.22255@crd.ge.com> Date: 28 Oct 92 13:25:55 GMT References: <1992Oct21.203742.3567@utagraph.uta.edu>,<jeff.720087205@mama> <00962AAE.508D1DE0@vms.csd.mu.edu> Sender: usenet@crd.ge.com (Required for NNTP) Reply-To: meltsner@crd.ge.com Organization: GE Research and Development Center Lines: 31 Nntp-Posting-Host: chipman.crd.ge.com