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Seminar -- Electrical and Computer Engineering Department
               +-----------------------------------------------+
               |   Title: Fault Tolerance in VLSI Systems      |
               |                                               |
               | Speaker: Prof. Shambhu Upadhyaya              |
               |      of: E&CE Dept., SUNYAB                   |
               +-----------------------------------------------+

    Location: Room 127 of Cooke Hall, Amherst Campus of SUNYAB

        Date: Friday, October 9, 1992

        Time: 3:00 PM  (Refreshments 2:45 PM)

 Information: SUNYAB Department of Electrical & Computer Engineering:
                    Dept. Office: (716) 645-2422  FAX: (716) 645-3656

ABSTRACT:
~~~~~~~~
   The advancement of the current technology has led to the evolution of
fault tolerance into a broad discipline encompassing all the aspects of
reliable computer design.  This includes testing, diagnosis, reconfiguration,
recovery and performance analysis.  Applications of fault tolerance typically
range from failure recovery mechanisms in integrated circuits as well as
large and complex systems to the design of robust software.
   High reliability is of paramount importance in systems of today.  For
example, reliability requirements of 10^-9 failures per hour over a 10-hour
mission time is typical of a space-borne system and the availability require-
ment of only 2 minutes downtime per year is standard in the ESS system of
Bell Telephone.  This talk is intended to provide an introduction to fault
tolerant computing.  The various kinds of protective redundancy schemes used
to overcome the failures from permanent, non-permanent and design faults in
the computing environment will be reviewed.  Emphasis will be placed on the
techniques used to recover from non-permanent faults which are known to be
predominant in computing systems.  Some of the results of the current
research in these areas will also be discussed.

BIOGRAPHY:
~~~~~~~~~
   Dr. Upadhyaya received his Ph.D. degree from the University of Newcastle,
Australia in 1986 in Electrical and Computer Engineering.  He was visiting
faculty at the University of Iowa during 1986 and joined SUNY at Buffalo in
Fall 1986 as an Assistant Professor.  His research interests are in fault-
tolerant computing, VLSI testing, knowledge-based systems, diagnostic reason-
ing, reliability and performance evaluation.  He is on the editorial board of
a new international journal on Reliability, Quality and Safety Engineering,
published by World Scientific.