Article View: comp.lsi.testing
Article #122RE: JTAG
From: Brad Garton
Date: Thu, 21 Jan 1993 22:49
Date: Thu, 21 Jan 1993 22:49
19 lines
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1262 bytes
I am using JTAG parts from TI, Xilinx and Motorola in a system
test application.
Don't yet have a lot of experience with JTAG except that
the costs are still a little hard to justify in extremely
1. you are able to do away with somephase of testing ( ICT -
or some functional)
2. I'ts use in the field can be demonstrated to save maintenance costs.
It is still a kind of chicken and egg problem in that without it
being implemented you are not going to prove 1 or 2.
Can't give out source code, sorry.
Brad
___________________________________________________________
| Brad Garton (512) 838-1333 | brad@titan.austin.ibm.com |
| I speak for myself not IBM | VNET: GARTON AT AUSTIN |
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Newsgroups: comp.lsi.testing Path: arc1-ca.pugleaf.net!sparky!uunet!cs.utexas.edu!geraldo.cc.utexas.edu!portal.austin.ibm.com!awdprime.austin.ibm.com!titan.austin.ibm.com!brad From: brad@titan.austin.ibm.com (Brad Garton) Subject: RE: JTAG Sender: news@austin.ibm.com (News id) Message-ID: <C187E5.s9F@austin.ibm.com> Date: Thu, 21 Jan 1993 22:49:17 GMT Reply-To: brad@titan.austin.ibm.com (Brad Garton) Organization: IBM Advanced Workstation Division Keywords: JTAG Lines: 19