IC Defect Statistics

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Article #125

#125

From: Gerald M. Spiegel
Date: Fri, 22 Jan 1993 14:41

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Anyone who deals with product quality and yield 
of integrated circuits probably has the same problem:
Where can I get realistic data about defect densities
and defect size distributions concerning a certain
manufacturing process? Well, so do I.

For my opinion, we should stick together and share 
the little information we have.
So here is my call: Please email ANY information 
you have about defect statistics, if you think it
might be usable. 
No, you are not asked to let out any internal 
company affairs, because the information shall 
be summarized and posted.

Any help is greatly appreciated.

Gerald M. Spiegel

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UNIVERSITY of KARLSRUHE (Germany)         
Department of Computer Science            
Institute of Computer Design 
and Fault Tolerance                       Phone (+49) (721) 608 4227
P.O. Box 69 80                            FAX   (+49) (721) 370  455  
W-7500 Karlsruhe 1                        email: gerald@ira.uka.de 
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Path: arc1-ca.pugleaf.net!sparky!uunet!spool.mu.edu!yale.edu!ira.uka.de!uka!i80s20!gerald
From: gerald@i80s20.ira.uka.de (Gerald M. Spiegel)
Newsgroups: comp.lsi.testing,comp.lsi,comp.lsi.cad
Subject: IC Defect Statistics
Date: 22 Jan 1993 14:41:43 GMT
Organization: University of Karlsruhe, FRG
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