Re: Readership

Article View: comp.lsi.testing

Article #200

#200

From: Daniel Romanchik
Date: Wed, 13 Jan 1993 03:57

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=====================================================================
        Dan Romanchik              |        danr@umcc.ais.org
       Technical Editor            |         (313) 930-6564
    Test & Measurement World       |     MCI Mail: tmwromanchik
=====================================================================
 For a free copy of Test & Measurement World, the magazine for test 
  and inspection in electronics, send me your U.S. Mail address.
=====================================================================

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Message-ID: <C0rxoE.Kux@ais.org>

Path: arc1-ca.pugleaf.net!sparky!uunet!hela.iti.org!ais.org!danr

References: <KENB.93Jan11132835@bigears.dadd.ti.com>

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Newsgroups: comp.lsi.testing
Path: arc1-ca.pugleaf.net!sparky!uunet!hela.iti.org!ais.org!danr
From: danr@ais.org (Daniel Romanchik)
Subject: Re: Readership
Message-ID: <C0rxoE.Kux@ais.org>
Organization: UMCC
References: <KENB.93Jan11132835@bigears.dadd.ti.com>
Distribution: comp
Date: Wed, 13 Jan 1993 03:57:49 GMT
Lines: 8

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