Article View: comp.lsi.testing
Article #76Re: test
From: Michele Favalli
Date: Tue, 13 Oct 1992 17:39
Date: Tue, 13 Oct 1992 17:39
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1292 bytes
I was at ITC, one of the most important issues in this conferences is the presence of a few papers presenting failure analysis data collected on samples of chips that are meaningful from a statistical point of view. Michele Favalli ============================================================================== Michele Favalli DEIS - University of Bologna tel. 39-51-644-3082 Viale Risorgimento 2 fax. 39-51-644-3073 40136 Bologna - ITALY e-mail: michele@deis16.cineca.it ==============================================================================
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<1992Oct7.120814.17790%sjlia@Uz.nthu.edu.tw> <1av3b5INN26e@darkstar.UCSC.EDU> <KENB.92Oct13091101@bigears.dadd.ti.com>Show Full Headers
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Path: arc1-ca.pugleaf.net!sparky!uunet!pmafire!news.dell.com!swrinde!zaphod.mps.ohio-state.edu!caen!batcomputer!ghost.dsi.unimi.it!37.1!deis24!michele Newsgroups: comp.lsi.testing Subject: Re: test Message-ID: <1992Oct13.183938.567@cine88.cineca.it> From: michele@deis24.cineca.it (Michele Favalli) Date: 13 Oct 92 18:39:37 +0100 Sender: michele@deis24 (Michele Favalli) References: <1992Oct7.120814.17790%sjlia@Uz.nthu.edu.tw> <1av3b5INN26e@darkstar.UCSC.EDU> <KENB.92Oct13091101@bigears.dadd.ti.com> Distribution: world Organization: Dept. of Electronics, Computer Science & Systems, Univ. of Bologna, Italy Nntp-Posting-Host: deis24.cineca.it Lines: 15