Article View: comp.lsi.testing
Article #77Re: test
From: David C. Black
Date: Wed, 14 Oct 1992 13:41
Date: Wed, 14 Oct 1992 13:41
17 lines
1356 bytes
1356 bytes
In article <1992Oct13.183938.567@cine88.cineca.it> michele@deis24.cineca.it (Michele Favalli) writes: > >I was at ITC, one of the most important issues in this conferences is the >presence of a few papers presenting failure analysis data collected on >samples of chips that are meaningful from a statistical point of view. > >Michele Favalli Would you care to elaborate on the types of chips and failures reported? Perhaps give a reference or two? I would be interested in ordering a copy of the papers if available. -- | David C. Black Electrical Engineer (hardware/software)| | Tandem Computers Incorporated Guardian: SMTPGATE@AUSTIN(black@tzone) | | 14231 Tandem Blvd. Internet: black@mpd.tandem.com | |_Austin, Texas 78728-6699________Phone: 512/244-8321__FAX_512/244-8247__|
Technical Details
Message-ID:
<2638@devnull.mpd.tandem.com>Path:
arc1-ca.pugleaf.net!sparky!uunet!cs.utexas.edu!devnull!blackReferences:
<1992Oct7.120814.17790%sjlia@Uz.nthu.edu.tw> <1av3b5INN26e@darkstar.UCSC.EDU> <KENB.92Oct13091101@bigears.dadd.ti.com> <1992Oct13.183938.567@cine88.cineca.it>Show Full Headers
Complete Article Headers
Path: arc1-ca.pugleaf.net!sparky!uunet!cs.utexas.edu!devnull!black From: black@mpd.tandem.com (David C. Black) Newsgroups: comp.lsi.testing Subject: Re: test Message-ID: <2638@devnull.mpd.tandem.com> Date: 14 Oct 92 13:41:18 GMT References: <1992Oct7.120814.17790%sjlia@Uz.nthu.edu.tw> <1av3b5INN26e@darkstar.UCSC.EDU> <KENB.92Oct13091101@bigears.dadd.ti.com> <1992Oct13.183938.567@cine88.cineca.it> Sender: news@devnull.mpd.tandem.com Reply-To: black@io.UUCP (David C. Black) Organization: /etc/organization Lines: 17