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Article #3431Re: OTP (really?) EPROMS
From: Mark Robert Thorson
Date: Sun, 15 Oct 1989 20:34
Date: Sun, 15 Oct 1989 20:34
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davidc@vlsisj.VLSI.COM (David Chapman) says: > You'd better believe they test the whole thing with wafer probing. No > semiconductor company worth its salt would ship partially-tested chips. That's true when such testing is possible. FPLA's and PAL's, however, must be shipped with only partial testing because the fusemap can't be tested without burning it.
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Path: arc1-ca.pugleaf.net!utzoo!utgpu!jarvis.csri.toronto.edu!mailrus!wuarchive!wugate!uunet!portal!cup.portal.com!mmm From: mmm@cup.portal.com (Mark Robert Thorson) Newsgroups: sci.electronics Subject: Re: OTP (really?) EPROMS Message-ID: <23127@cup.portal.com> Date: 15 Oct 89 20:34:52 GMT References: <841@dms.UUCP> <15357@vlsisj.VLSI.COM> Distribution: usa Organization: The Portal System (TM) Lines: 8