TEM samples

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Article #305

#305

From: Sushil Bharatan
Date: Tue, 22 Dec 1992 18:46

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I require information on preparation of cross-sectional TEM samples
of a semi-conductor material deposited on 0001 sapphire substrate.
I am currently using a dicing saw for cutting strips that are about
15 mils in width, but extensive cracking and chipping occur.
Any information on dicing saw blade manufacturers and alternative
methods is welcome.

Thanks,
Sushil Bharatan
Dept. of Materials Science and Engineering,
University of Florida.

email:sushilb@elm.circa.ufl

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Path: arc1-ca.pugleaf.net!sparky!uunet!spool.mu.edu!tulane!uflorida!elm.circa.ufl.edu!sushilb
From: sushilb@elm.circa.ufl.edu (Sushil Bharatan)
Newsgroups: sci.materials
Subject: TEM samples
Keywords: sapphire,TEM
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Date: 22 Dec 92 18:46:12 GMT
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