Article View: sci.materials
Article #347Re: TEM samples
From: yuanj
Date: Thu, 24 Dec 1992 03:34
Date: Thu, 24 Dec 1992 03:34
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In article <009657AA.10D74A80@vms.csd.mu.edu>, 5916rahmank@vms.csd.mu.edu ( ) writes:
>
> Sushil,
>
> Dicing saw may not be a good thing to use to cut non-metallic
> samples. Instead, you may use a diamond wafering blade with water as
> the cutting fluid. If you are going to make TEM samples, you need
> lot less thicker sample than 15 mil. It is wiser to cut a little
> thicker and then polish it to thin.
Usually, for brittle materials, you need to use what is called
ion-mill to thin the sample down to your desired thickness, which is less than
10 micron I think.
The ion-mill is a ion bombardment system. Argon atoms are
ionized and accelerated to the sample, therefore kicking off the materials very
slowly.
Hope this helps.
J. Yuan
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Path: arc1-ca.pugleaf.net!sparky!uunet!spool.mu.edu!uwm.edu!linac!att!cbnewsc!cbfsb!att-out!ucbeh.san.uc.edu!yuanj From: yuanj@ucbeh.san.uc.edu Newsgroups: sci.materials Subject: Re: TEM samples Message-ID: <1992Dec23.223407.2304@ucbeh.san.uc.edu> Date: 23 Dec 92 22:34:07 EST References: <38005@uflorida.cis.ufl.edu> <009657AA.10D74A80@vms.csd.mu.edu> Distribution: usa,world Organization: Univ. of Cincinnati Lines: 18