Article View: sci.materials
Article #420Re: Mat'ls meas. war stories
From: 5916rahmank
Date: Sun, 10 Jan 1993 22:34
Date: Sun, 10 Jan 1993 22:34
87 lines
4919 bytes
4919 bytes
In article <1993Jan9.210224.9365@noose.ecn.purdue.edu>, sankar@lira.ecn.purdue.edu (Mahalingam
Sankararaman) writes:
>In article <0096652F.B2E94A20@vms.csd.mu.edu> 5916rahmank@vms.csd.mu.edu
writes:
In article <64400002@hpscit.sc.hp.com>, markus@hpscit.sc.hp.com (Markus
Jansons) writes:
Does any one have any interesting or new applications experience
with maeterials measurments using "electrical" methods.
For example, maeauring capacitance and then calculating dielectric
constant? What did you use for fixtures or transducers? If you
have or know of anyone doing or would like to do such measurements
please advise me.
Sankar:
What do you mean by fixers or transducers. If you just want to measure
the capacitance, just sputter some electrodes such as platinum and use
one of the instruments your company (HP) makes to measure the
capacitance.
But if your aim is to do materials characterization using Impedance
Spectroscopy, then it is not trivial.
I (Anis) replied earlier:
Perhaps the best way of doing the electrical characterization is
the use of Impedance spectroscopy a.k.a immittance spectroscopy.
J. Ross Macdonald's book is an excellent treatment on the whole
subject including experimental setups.
Sankar writes:
Impedance Spectroscopy, though it is been used for a long time, is
still in its infancy. McDonalds book is perhaps the only book
written on this subject. He is also responsible for coining the
term Impedance Spectroscopy. I recently saw a company (Solartron ?)
demonstrating ac measurements system using McDonalds methods and
his software developments. But my concern is treating capacitances
arising from real materials as ideal Debye capacitance. In fact it
has been shown real material relaxation is non-ideal and in some
cases it can be modeled in terms of an empirical formula to account for
the frequency dependence.
================================
A. K. Jonscher published his book "Dielectric relaxation in Solids,"
Chelsea Dielectric Press, London, 1983, which is basically a
treatment of impedance spectroscopy. Other than that Macdonald's
(Not McDonald) book "Impedance Spectroscopy Emphasizing Solid
Materials and Systems," is perhaps the only book on this subject.
The term 'Impedance Spectroscopy' is in market for a long time.
What Macdonald coined is the term 'Immittance Spectroscopy' that
unifies all for complex electrical observables, namely,
Impedance, Admittance, Capacitance (or dielectric constant) and
Modulus under a single name. The reason for this terminology is
the fact that once a frequency dispersion data (aka the immittance
spectra) measured, it can be represented in any of the above
four representations.
Immittance Spectroscopy (IS) never treats a measured capacitance
as ideal Debye response unless the spectra exhibit that, that is
indeed the case (i.e., a zero depression angle). What Macdonald
Boukamp, Seitz, and many others have shown is a thing called
the 'Constant Phase Element' to represent the non-Debye behavior
of real material systems.
However, the other approach is to approximate a complex response
by a 'Lumped parameter equivalent circuit.' This has been claimed to
be reasonable for many materials system by many authors, but again
the choice should not be just a gross hand waving rather should be
based on the experimental evidences. Macdonald's book elaborate
quite a bit on this topic.
Nevertheless, I agree with the statement that IS is in its
childhood. The main reason for that, perhaps, although numerous
people used this technique and published paper - not lot of
Engineers or Scientists wrote book on it. The reason for that, in
turn, may be the fact that - this technique is mostly instrumental.
Also only a limited group of materials are well characterized by
this technique. Or there may be more intricate reasons. I would
invite others to take part in this thread. I would be interested
in seeing more discussion on this topic. So long.
-Anis.
Technical Details
Message-ID:
<0096668D.8200A2A0@vms.csd.mu.edu>Path:
arc1-ca.pugleaf.net!sparky!uunet!olivea!spool.mu.edu!vms.csd.mu.edu!5916RAHMANKReferences:
<64400002@hpscit.sc.hp.com> <0096652F.B2E94A20@vms.csd.mu.edu>,<1993Jan9.210224.9365@noose.ecn.purdue.edu>Show Full Headers
Complete Article Headers
Path: arc1-ca.pugleaf.net!sparky!uunet!olivea!spool.mu.edu!vms.csd.mu.edu!5916RAHMANK From: 5916rahmank@vms.csd.mu.edu ( ) Newsgroups: sci.materials Subject: Re: Mat'ls meas. war stories Message-ID: <0096668D.8200A2A0@vms.csd.mu.edu> Date: 10 Jan 93 22:34:07 GMT References: <64400002@hpscit.sc.hp.com> <0096652F.B2E94A20@vms.csd.mu.edu>,<1993Jan9.210224.9365@noose.ecn.purdue.edu> Reply-To: 5916rahmank@vms.csd.mu.edu Organization: Department of EECE, Marquette University Lines: 87 NNTP-Posting-Host: vmsf.csd.mu.edu