🚀 go-pugleaf

This makes three test messages from taiwan from three separate people in
the first half of this week.  This sounds like a dangerous trend.  Anyone
who actually works on IC test in taiwan who can figure out how to communicate
to these people that this is an inappropriate use of our newsgroup could
become our personal hero.

As it is, each person can learn that he or she acted inappropriately, but 
something is giving the idea to post here to multiple people at the same
site.

Just to insert something on testing, speaking as someone who was unable to
attend ITC this year because of administrative obligations, I would love
to know what the hallway-scuttlebut said were the most exciting papers.  I
have access to the proceedings, but it is a thick book.  I missed hearing 
people chat in the hallways about "so-and-so's outrageous talk" or
"what's his name's new insight." 

I think the volume on this group is low enough that just posting opinions
would be of most value, but feel free to send me mail.
--
Tracy Larrabee		larrabee@cse.ucsc.edu

Tracy,

Regarding "Re: test", you write:

Tracy> Just to insert something on testing, speaking as someone who was
Tracy> unable to attend ITC this year because of administrative
Tracy> obligations, I would love to know what the hallway-scuttlebut said
Tracy> were the most exciting papers.  I have access to the proceedings,
Tracy> but it is a thick book.  I missed hearing people chat in the
Tracy> hallways about "so-and-so's outrageous talk" or "what's his name's
Tracy> new insight."

I think that the Maxwell, Aitken, Johansen, and Chiang paper garnered
considerable interest from the crowds.  I also noted that sessions
containing papers on IDDQ testing seemed to have a large number of
attendees in general.

I'm sure that there were others with large crowd draws, but those are the
examples that I remember.  Anybody else have an additional/different
impressions than I did?

Ken
--

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Kenneth M. Butler                           (214) 997-6370 (office)
Texas Instruments                           (214) 997-2049 (FAX)
P.O. Box 655303 MS 3683                     kenb@dadd.ti.com
Dallas, TX 75265
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I was at ITC, one of the most important issues in this conferences is the 
presence of a few papers presenting failure analysis data collected on  
samples of chips that are meaningful from a statistical point of view. 

Michele Favalli

============================================================================== 

Michele Favalli 
DEIS - University of Bologna                 tel. 39-51-644-3082 
Viale Risorgimento 2                         fax. 39-51-644-3073
40136 Bologna - ITALY                        e-mail: michele@deis16.cineca.it 

==============================================================================

In article <1992Oct13.183938.567@cine88.cineca.it> michele@deis24.cineca.it
(Michele Favalli) writes:
>
>I was at ITC, one of the most important issues in this conferences is the 
>presence of a few papers presenting failure analysis data collected on  
>samples of chips that are meaningful from a statistical point of view. 
>
>Michele Favalli

Would you care to elaborate on the types of chips and failures reported?
Perhaps give a reference or two?  I would be interested in ordering a
copy of the papers if available.
-- 
| David C. Black                  Electrical Engineer (hardware/software)|
| Tandem Computers Incorporated   Guardian: SMTPGATE@AUSTIN(black@tzone) |
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