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Benchmark Circuits for Digital circuit test pattern generation
From: 8809787l
Date: Wed, 19 Aug 1992 15:40
Article: 23
Message-ID: <18341.2a92f106@levels.unisa.edu.au>
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- Subject: Benchmark Circuits for Digital circuit test pattern generation
- From: 8809787l
- Date: Wed, 19 Aug 1992 15:40
- Article: 23